ESR5: Study of SEU sensitivity of SRAM-Based Radiation Monitors in 65 nm CMOS
J. Wang (ESR5), J. Prinzie, A. Coronetti (ESR15), S. Thys, R. Garcia Alia, P. Leroux
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 913-920, May 2021.
Check out paper here.
What does RADSAGA mean?
RADSAGA stands for RADiation and Reliability Challenges for Electronics used in
- Space,
- Aviation,
- Ground and
- Accelerators
Publications
ESR2: Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
D. Soderstrom (ESR2), L. Matana-Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Gilardi, A. Coronetti (ESR15), C. Poivey, L. Dilillo.
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp.716-723, May 2021.
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WP2: Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technology
C. Martinella, R. Garcia Alia, R. Stark, A. Coronetti (ESR15), C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, A. Javanainen.
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 634-641, May 2021.
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WP1: 0.1-10 MeV neutron soft error rate in accelerator and atmospheric environments
M. Cecchetto, R. Garcia Alia, F. Wrobel, A. Coronetti (ESR15), K. Bilko, D. Lucsanyi, S. Fiore, G. Bazzano, E. Pirovano, R. Nolte.
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp.873-883 May 2021.
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ESR15: Radiation hardness assurance through system-level testing: risk acceptance, facility requirements, test methodology and data exploitation
Andrea Coronetti (ESR15), Ruben Garcıa Alıa, Jan Budroweit, Tomasz Rajkowski (ESR12), Israel Da Costa Lopes (ESR13), Kimmo Niskanen (ESR7), Daniel Soderstrom (ESR2), Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois, Nourdine Kerboub, Alexander Koelpin, Frederic Saigne, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, and Rosine Coq Germanicus.
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 958-969, May 2021.
ESR15: Assessment of proton direct ionization for the radiation hardness assurance of deep sub-micron SRAMs used in space applications
A. Coronetti (ESR15), R. Garcia Alia, J. Wang (ESR5), M. Tali, M. Cecchetto, A. Javanainen, F. Saigné, P. Leroux.
IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 937-948, May 2021.
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ESR9: Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 114, no. 113877, November 2020.
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WP2: Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation
R.B. Schvittz, Y. Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, L.S. Rosa, and. P.F Butzen.
Microelectronics Reliability, vol. 114, no. 113871, Novermber 2020.
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ESR10: Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge
S. Guagliardo (ESR10), F. Wrobel, Y Aguiar (ESR9), J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 119, no. 114087, April 2021.
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ESR15: SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Andrea Coronetti (ESR15), Matteo Cecchetto, Jialei Wang (ESR5), Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Rubén García Alía, Carlo Cazzaniga, Yolanda Morilla, Pedro Martìn-Holgado, Marc-Jan van Goethem, Harry Kiewiet, Emil van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura Sinkunaite, Miroslaw Marszalek, Heikki Kettunen, Mikko Rossi, Jukka Jaatinen, Arto Javanainen, Marie-Helene Moscatello, Anthony Dubois, Salvatore Fiore, Giulia Bazzano, Christopher Frost, Manon Letiche, Wilfrid Farabolini,