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C. Martinella, R. Garcia Alia, R. Stark, A. Coronetti (ESR15), C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, A. Javanainen.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 634-641, May 2021.

Check out paper here.

WP2: Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technology