Publications

ESR6: A Review of Semiconductor Based Ionising Radiation Sensors Used in Harsh Radiation Environments and Their Applications

A. Karmakar (ESR6), J. Wang (ESR5), J. Prinzie, V. De Smedt, P. Leroux.

MDPI Radiation, vol. 1, no. 3, pp. 194-217, May 2021.

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ESR12: Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches

T. Rajkowski (ESR12), F. Saigné, K. Niskanen (ESR7), J. Boch, T. Maraine, P. Kohler, P. Dubus, A. Touboul, P. Wang.

MDPI Electronics, vol. 10, no. 11, art. no. 1235, May 2021.

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ESR7: Neutron induced failure dependence on reverse gate voltage for SiC Power MOSFETs in atmospheric environment

K. Niskanen (ESR7), R. Coq Germanicus, A. Michez, F. Wrobel, J. Boch, F. Saigné, A.D. Touboul.

IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1623-1632, August 2021.

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ESR15: The pion single-event latch-up cross-section enhancement: mechanisms and consequences for accelerator hardness assurance

A. Coronetti (ESR15), R. Garcia, Alia, F. Cerutti, W. Hajdas, D. Soderstrom (ESR2), A. Javanainen, F. Saigné.

IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1613-1622, August 2021.

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ESR5: Study of SEU sensitivity of SRAM-Based Radiation Monitors in 65 nm CMOS

J. Wang (ESR5), J. Prinzie, A. Coronetti (ESR15), S. Thys, R. Garcia Alia, P. Leroux

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 913-920, May 2021.

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ESR2: Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

D. Soderstrom (ESR2), L. Matana-Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Gilardi, A. Coronetti (ESR15), C. Poivey, L. Dilillo.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp.716-723, May 2021.

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WP3: Microprocessor Error Diagnosis by Trace Monitoring under Laser Testing

M. Pena-Fernandez, A. Lindoso, L. Entrena, I. Lopes (ESR13), V. Pouget.

IEEE Trans. Nucl. Sci., vol. 68, 2021.

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WP2: Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technology

C. Martinella, R. Garcia Alia, R. Stark, A. Coronetti (ESR15), C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, A. Javanainen.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 634-641, May 2021.

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WP1: 0.1-10 MeV neutron soft error rate in accelerator and atmospheric environments

M. Cecchetto, R. Garcia Alia, F. Wrobel, A. Coronetti (ESR15), K. Bilko, D. Lucsanyi, S. Fiore, G. Bazzano, E. Pirovano, R. Nolte.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp.873-883 May 2021.

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ESR15: Radiation hardness assurance through system-level testing: risk acceptance, facility requirements, test methodology and data exploitation

Andrea Coronetti (ESR15), Ruben Garcıa Alıa, Jan Budroweit, Tomasz Rajkowski (ESR12), Israel Da Costa Lopes (ESR13), Kimmo Niskanen (ESR7), Daniel Soderstrom (ESR2), Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois, Nourdine Kerboub, Alexander Koelpin, Frederic Saigne, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, and Rosine Coq Germanicus.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 958-969, May 2021.

Read more about ESR15: Radiation hardness assurance through system-level testing: risk acceptance, facility requirements, test methodology and data exploitation