Publications

ESR12: Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches

Submitted by acoronet on Sat, 05/22/2021 - 15:24

T. Rajkowski (ESR12), F. Saigné, K. Niskanen (ESR7), J. Boch, T. Maraine, P. Kohler, P. Dubus, A. Touboul, P. Wang.

MDPI Electronics, vol. 10, no. 11, art. no. 1235, May 2021.

Check out paper here.

ESR15: The pion single-event latch-up cross-section enhancement: mechanisms and consequences for accelerator hardness assurance

Submitted by acoronet on Sat, 05/15/2021 - 17:15

A. Coronetti (ESR15), R. Garcia, Alia, F. Cerutti, W. Hajdas, D. Soderstrom (ESR2), A. Javanainen, F. Saigné.

IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1613-1622, August 2021.

Check out paper here.

ESR15: Radiation hardness assurance through system-level testing: risk acceptance, facility requirements, test methodology and data exploitation

Submitted by acoronet on Sat, 05/15/2021 - 17:05

Andrea Coronetti (ESR15), Ruben Garcıa Alıa, Jan Budroweit, Tomasz Rajkowski (ESR12), Israel Da Costa Lopes (ESR13), Kimmo Niskanen (ESR7), Daniel Soderstrom (ESR2), Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois, Nourdine Kerboub, Alexander Koelpin, Frederic Saigne, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, and Rosine Coq Germanicus.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 958-969, May 2021.