D. Söderström (ESR2), L. Matana Luza, A. Bosser, T. Gil, K.-O. Voss, H. Kettunen, A. Javanainen, L. Dilillo.
Proceedings of the 2019 RADECS Conference, Montpellier, France.
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A. Coronetti (ESR15), F. Manni, J. Mekki, D. Dangla, C. Virmontois, N. Kerboub, R. Garcia Alia.
Proceedings of the 2019 RADECS Conference, Montpellier, France.
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V. Gupta, A. Besser, L. Matana Luza, D. Söderström (ESR2), A. Javanainen, H. Kettunen, J. Praks, K.-O. Voss, A. Virtanen, L. Dilillo.
Proceedings of the 2019 RADECS Conference, Montpellier, France.
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S. Guagliardo (ESR10), F. Wrobel, Y. Aguiar (ESR9), J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Proceeding of the 2019 RADECS Conference, Montpellier, France.
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A. Karmakar (ESR6), V. De Smedt, P. Leroux.
MDPI Electronics, vol. 11., no. 9, art no. 1399, April 2022.
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G. Lerner, A. Coronetti (ESR15), J. Kempf, R. Garcia Alia, F. Cerutti, D. Prelipcean, M. Cecchetto, A. Gilardi, W. Farabolini, R. Corsini.
IEEE Trans. Nucl. Sci., vol., no., pp., August 2022.
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A. Karmakar (ESR6), V. De Smedt, P. Leroux.
2021 IEEE International Symposium on Circuits and Systems (ISCAS).
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A. Karmakar (ESR6), V. De Smedt, P Leroux.
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS).
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L. Matana-Luza, D. Söderström (ESR2), G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, L. Dilillo.
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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S. Lüdeke (ESR1) and Arto Javanainen.
IEEE Trans. Nucl. Sci., vol. 69, no. 3, pp. 254-263, March 2022.
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