L. Matana-Luza, D. Söderström (ESR2), G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, L. Dilillo.
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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S. Lüdeke (ESR1) and Arto Javanainen.
IEEE Trans. Nucl. Sci., vol. 69, no. 3, pp. 254-263, March 2022.
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T. Rajkowski (ESR12), F. Saigné, P. Wang.
MDPI Electronics, vol. 11, no. 3, art no. 378, Jan. 2022.
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A. Coronetti (ESR15), R. Garcia Alia, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Bilko, P. Martin-Holgado.
2021 IEEE NSREC Radiation Effects Data Workshop, pp. 32-36.
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I. Lopes (ESR13), V. Pouget, F. Wrobel, A. Touboul, F. Saigné, K Roed.
IEEE Trans. Nucl. Sci., vol. 69, no. 7, pp. 1747-1756, July 2022.
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C. Cazzaniga, R. Garcia Alia, A. Coronetti (ESR15), K. Bilko, Y. Morilla, P. Martin Holgado, M. Kastriotou, C.D. Frost.
IEEE Trans. Nucl. Sci., vol. 69, no. 3, pp. 485-490, March 2022.
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A. Karmakar (ESR6), J. Wang (ESR5), J. Prinzie, V. De Smedt, P. Leroux.
MDPI Radiation, vol. 1, no. 3, pp. 194-217, May 2021.
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T. Rajkowski (ESR12), F. Saigné, K. Niskanen (ESR7), J. Boch, T. Maraine, P. Kohler, P. Dubus, A. Touboul, P. Wang.
MDPI Electronics, vol. 10, no. 11, art. no. 1235, May 2021.
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K. Niskanen (ESR7), R. Coq Germanicus, A. Michez, F. Wrobel, J. Boch, F. Saigné, A.D. Touboul.
IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1623-1632, August 2021.
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A. Coronetti (ESR15), R. Garcia, Alia, F. Cerutti, W. Hajdas, D. Soderstrom (ESR2), A. Javanainen, F. Saigné.
IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1613-1622, August 2021.
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