WP3: Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Submitted by acoronet on Mon, 01/31/2022 - 08:51

L. Matana-Luza, D. Söderström (ESR2), G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, L. Dilillo.

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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ESR12: Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches

Submitted by acoronet on Sat, 05/22/2021 - 15:24

T. Rajkowski (ESR12), F. Saigné, K. Niskanen (ESR7), J. Boch, T. Maraine, P. Kohler, P. Dubus, A. Touboul, P. Wang.

MDPI Electronics, vol. 10, no. 11, art. no. 1235, May 2021.

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ESR15: The pion single-event latch-up cross-section enhancement: mechanisms and consequences for accelerator hardness assurance

Submitted by acoronet on Sat, 05/15/2021 - 17:15

A. Coronetti (ESR15), R. Garcia, Alia, F. Cerutti, W. Hajdas, D. Soderstrom (ESR2), A. Javanainen, F. Saigné.

IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1613-1622, August 2021.

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