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L. Matana-Luza, D. Söderström (ESR2), G. Tsiligiannis, H. Puchner, C. Cazzaniga, E. Sanchez, A. Bosio, L. Dilillo.

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Check out paper here.

WP3: Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems