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K. Niskanen (ESR7), R. Coq Germanicus, A. Michez, F. Wrobel, J. Boch, F. Saigné, A.D. Touboul.

IEEE Trans. Nucl. Sci., vol. 68, no. 8, pp. 1623-1632, August 2021.

Check out paper here.

ESR7: Neutron induced failure dependence on reverse gate voltage for SiC Power MOSFETs in atmospheric environment