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J. Wang (ESR5), J. Prinzie, A. Coronetti (ESR15), S. Thys, R. Garcia Alia, P. Leroux

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp. 913-920, May 2021.

Check out paper here.

ESR5: Study of SEU sensitivity of SRAM-Based Radiation Monitors in 65 nm CMOS