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Andrea Coronetti (ESR15), Matteo Cecchetto, Jialei Wang (ESR5), Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Rubén García Alía, Carlo Cazzaniga, Yolanda Morilla, Pedro Martìn-Holgado, Marc-Jan van Goethem, Harry Kiewiet, Emil van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura Sinkunaite, Miroslaw Marszalek, Heikki Kettunen, Mikko Rossi, Jukka Jaatinen, Arto Javanainen, Marie-Helene Moscatello, Anthony Dubois, Salvatore Fiore, Giulia Bazzano, Christopher Frost, Manon Letiche, Wilfrid Farabolini, Antonio Gilardi, Roberto Corsini, and Helmut Puchner.

2020 IEEE Radiation Effects Data Workshop, pp. 56-63, 2020.

Check out paper at this link.

ESR15: SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below