WP3: Heavy Ion-Induced SEE and Co-60 TID Effects Testing on Commercial Logic Devices
P. Kohler, A. Bosser, T. Rajkowski (ESR12), F. Saigné, P. X. Wang, A. Sanchez, L. Puybusque, and L. Gouyet.
2020 IEEE Radiation Effects Data Workshop, pp. 123-127, 2020.
Check out paper at this link.