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P. Kohler, A. Bosser, T. Rajkowski (ESR12), F. Saigné, P. X. Wang, A. Sanchez, L. Puybusque, and L. Gouyet.

2020 IEEE Radiation Effects Data Workshop, pp. 123-127, 2020.

Check out paper at this link.

WP3: Heavy Ion-Induced SEE and Co-60 TID Effects Testing on Commercial Logic Devices