Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A. Touboul.
Microelectronics Reliability, 2020.
Check out paper at this link.
Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A. Touboul.
Microelectronics Reliability, 2020.
Check out paper at this link.