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R.B. Schvittz, Y. Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, L.S. Rosa, and. P.F Butzen.

Microelectronics Reliability, vol. 114, no. 113871, Novermber 2020.

Check out paper here.

WP2: Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation