R.B. Schvittz, Y. Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, L.S. Rosa, and. P.F Butzen.
Microelectronics Reliability, vol. 114, no. 113871, Novermber 2020.
Check out paper here.
R.B. Schvittz, Y. Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, L.S. Rosa, and. P.F Butzen.
Microelectronics Reliability, vol. 114, no. 113871, Novermber 2020.
Check out paper here.