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S. Guagliardo (ESR10), F. Wrobel, Y Aguiar (ESR9), J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.

Microelectronics Reliability, vol. 119, no. 114087, April 2021.

Check out paper at this link.

ESR10: Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge