S. Guagliardo (ESR10), F. Wrobel, Y Aguiar (ESR9), J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 119, no. 114087, April 2021.
Check out paper at this link.
S. Guagliardo (ESR10), F. Wrobel, Y Aguiar (ESR9), J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 119, no. 114087, April 2021.
Check out paper at this link.