Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 114, no. 113877, November 2020.
Check out paper here.
Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul.
Microelectronics Reliability, vol. 114, no. 113877, November 2020.
Check out paper here.