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D. Soderstrom (ESR2), L. Matana-Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Gilardi, A. Coronetti (ESR15), C. Poivey, L. Dilillo.

IEEE Trans. Nucl. Sci., vol. 68, no. 5, pp.716-723, May 2021.

Check out paper here.

ESR2: Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment