RADSAGA stands for RADiation and Reliability Challenges for Electronics used in
This document deals with the growing interest in radiation testing of state-of-the-art electronics to be used in avionics, ground and accelerator applications. That is, its function is to provide guidance about the suitability of using certain irradiation instruments, such as 14 MeV mono-energetic neutron sources, for Single Event Effect (SEE) characterization of electronic equipment.
This deliverable provides a review on hardening by design techniques, tools and modelling for radiation effects on electronics provided by ESR9 and ESR10, in the scope of the RADSAGA WP2. Further, aging mechanisms modelling and the test structure design developed by ESR8 are also reported. Radiation effects on electronics can be classified into two groups: the cumulative effects, caused by atomic displacement damage or ionizing dose due to radiation exposure of the component; and, the single-event effects (SEE) caused by a single particle event that can induce destructive or non-destructive effects. This report will focus mainly on the single-event effects such as Single-Event Upset (SEU), Single-Event Transient (SET) and Single-Event Latchup (SEL).
This report summarizes different system level radiation tests performed within RADSAGA project in order to compare system level approach used with standard component level approach. Performed tests include Total Ionizing Dose (TID) and Single Event Effect (SEE) tests in “standard test facilities” (Co-60, heavy ions), as well as tests in not standard test facilities (mixed field, highly penetrating ultrahigh energy heavy ions).
This deliverable contains information over the radiation hardening assurance (RHA) approaches applied in various European radiation test facilities and irradiation institutes.