This deliverable provides a review on hardening by design techniques, tools and modelling for radiation effects on electronics provided by ESR9 and ESR10, in the scope of the RADSAGA WP2. Further, aging mechanisms modelling and the test structure design developed by ESR8 are also reported. Radiation effects on electronics can be classified into two groups: the cumulative effects, caused by atomic displacement damage or ionizing dose due to radiation exposure of the component; and, the single-event effects (SEE) caused by a single particle event that can induce destructive or non-destructive effects. This report will focus mainly on the single-event effects such as Single-Event Upset (SEU), Single-Event Transient (SET) and Single-Event Latchup (SEL).
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