Y.Q. Aguiar (ESR9), F. Wrobel, J.L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget
Microelectronics Reliability, Vo. 88-90, Pages 920-924, September 2018
Check out paper at this link.
Y.Q. Aguiar (ESR9), F. Wrobel, J.L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget
Microelectronics Reliability, Vo. 88-90, Pages 920-924, September 2018
Check out paper at this link.