Submitted by acoronet on

Y.Q. Aguiar (ESR9), F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A. Touboul.

Microelectronics Reliability, 2020.

Check out paper at this link.

ESR9: Reliability-driven pin assignment optimization to improve in-orbit soft-error rate