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K. Niskanen (ESR7), A. D. Touboul. R. Coq Germanicus, A. Michez, A. Javanainen, F. Wrobel, J. Boch, V. Pouget, F. Saigné.

IEEE Trans. Nucl. Sci., vol. 67, no. 7, pp. 1365-1373, July 2020.

Check out paper at this link.

ESR7: Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET