Poster Presentation at ESREF

The 30th European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis was held on September 23-27, 2019 in Toulouse, France. Ygor Aguiar (ESR09) participated to the conference and presented a poster about his research:

Radiation Hardening Efficiency of Gate Sizing and Transistor Stacking based on Standard Cells
Y. Q. Aguiar, F. Wrobel, S. Guagliardo, J-L. Autran, P. Leroux, F. Saigné, A. D. Touboul and V. Pouget.
(Published at Microelectronics Reliability: https://doi.org/10.1016/j.microrel.2019.113457 )