Eleven RADSAGA-featured presentations at RADECS and NSREC 2020

Throughout the challenging 2020 year, RADSAGA ESRs have not stopped making progress in radiation effects on electronics research. The two topical conferences, RADECS and NSREC (which will be held in virtual mode this year) feature 11 presentations from them as first authors. See the full list below.

RADECS 2020 (October 19th - November 20th) - link

Session C - Single event effects: mechanisms and modelling

• "The pion SEL cross-section enhancement mechanisms and consequences for accelerator RHA", A. Coronetti (ESR15), R. Garcìa Alìa, W. Hajdas, D. Söderström (ESR2), A. Javanainen, F. Saigné.
• "Single event burnout dependence on reverse gate bias voltage for SiC power MOSFETs in atmospheric environment", K. Niskanen (ESR7), A. Touboul, R. Germanicus, A. Michez, F. Wrobel, J. Boch, V. Pouget, F. Saigné.

Session G - Radiation hardness assurance

• "Bridging RHA methodology from component to system level applied to Systems-on-Modules", I. Lopes (ESR13), V. Pouget, F. Wrobel, A. Touboul, F. Saigné, K. Roed.

Session I - Facilities and dosimetry

• "Angular dependency of SRAM cross sections with ultra-high energy Pb beams", J. Wang (ESR5), J. Prinzie, S. Thys, P. Leroux.

NSREC 2020 (November 29th - December 30th) - link

Session C - Radiation effects in devices and integrated circuits

• "Electron-induced upsets and stuck bits in SDRAMs in the Jovian environment", D. Söderström (ESR2), L. Matana Luza, H. Kettunen, A. Javanainen, W. Farabolini, A. Gilardi, A. Coronetti, C. Poivey, L. Dilillo.
• "Comparison of TID-induced degradation of programmable logic timing in bulk 28 nm and 16 nm FinFET System-on-Chips under local X-ray irradiations", I. Lopes (ESR13), V. Pouget, F. Wrobel, A. Touboul, F. Saigné, J. Boch, T. Maraine, K. Roed.

Session G - Dosimetry

• "Study of SEU sensitivity of SRAM-based radiation monitors in 65-nm CMOS", J. Wang (ESR5), J. Prinzie, A. Coronetti (ESR15), S. Thys, R. Garcìa Alìa, P. Leroux.

Session H - Hardness Assurance

• "Assessment of proton direct ionization RHA for deep-submicron SRAMs used in space applications", A. Coronetti (ESR15), R. Garcìa Alìa, J. Wang, M. Cecchetto, C. Cazzaniga, Y. Morilla, P. Martìn-Holgado, M.-J. van Goethem, S. Brandenburg, A. Javanainen, F. Saigné, P. Leroux.
• "RHA through system-level testing: risk acceptance, facility requirements, test methodology and applications", A. Coronetti (ESR15), R. Garcìa Alìa, J. Budroweit, T. Rajkowski (ESR12), I. Lopes (ESR13), K. Niskanen (ESR7), D. Söderström (ESR2), C. Cazzaniga, R. Ferraro, S. Danzeca, J. Mekki, F. Manni, D. Dangla, A. Koelpin, F. Saigné, P. Wang, V. Pouget, A. Touboul, A. Javanainen, H. Kettunen, R. Germanicus.
• "Analysis of system-level TID test results of a System-in-Package point of load converter", T. Rajkowski (ESR12), P. Kohler, P. Dubus, P. Wang, F. Saigné, K. Niskanen, J. Boch, T. Maraine, A. Touboul.

Radiation Effects Data Workshop

• "SEU characterization of commercial and custom-designed SRAMs based on 65 nm technology and below", A. Coronetti (ESR15), M. Cecchetto, P. Fernandez-Martinez, A. Papadopoulou, K. Bilko, R. Garcìa Alìa, J. Wang (ESR5), M. Tali, M. Kastriotou, C. Cazzaniga, F. Castellani.