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This report details the status of the project on radiation-tolerant CMOS image sensors (ESR 11). The aim of this project is to provide new radiation hardening by design (RHBD) techniques for CMOS image sensors. Since an image sensor is a system with multiple components, effects of radiation in each of its components were investigated first based on literature. This is to determine which component contributes the most to changes on behavior of the system due to radiation.